HIOKI 3504-40 C HiTester
High-speed, Large-capacitance MLCC Inspection with Constant Voltage
High speed measurement of 2ms. Supports C measurements with voltage dependency characterist...
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HIOKI 3504-50 C HiTester
High-speed, Large-capacitance MLCC Inspection with Constant Voltage
High speed measurement of 2ms. Supports C measurements with voltage dependency characterist...
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HIOKI 3504-60 C HiTester
High-speed, Large-capacitance MLCC Inspection with Constant Voltage
High speed measurement of 2ms. Supports C measurements with voltage dependency characterist...
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HIOKI 3505 C HiTester
Source frequency 1 MHz, High-precision and ultra high speed measuring from small-value capacitance possible
Enhanced repeatability measurement accuracy, so fittes...
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HIOKI 3506 C HiTester
Source frequency 1 MHz, High-precision and ultra high speed measuring from small-value capacitance possible
Enhanced repeatability measurement accuracy, so fittes...
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HIOKI 3511-50 LCR HiTester
Compact & Powerful dedicated LCR measurement in 5 milli-second timeframes
High speed measurement: 5 ms (1 kHz) or 13 ms (120 Hz). High precision accuracy: ± ...
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HIOKI 3522-50 LCR HiTester
Increased measurement speed of up to 5msec !
DC, 1mHz to 100kHz, wide test frequency range LCR meter
High speed measurement of 5ms. High precision measureme...
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HIOKI 3532-50 LCR HiTester
Increased measurement speed of up to 5msec !
42Hz to 5MHz, wide test frequency range LCR meter
High speed measurement of 5ms. High precision measurement of ...
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HIOKI 3535 LCR HiTester
High-speed LCR meter with up to 120MHz sampling
High Speed Testing of Chip Inductors and Magnetic Heads in Research and Development
Broad Frequency Measurement...
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HIOKI IM3570 Impedance Analyzer
Single Device Solution for High Speed Testing and Frequency Sweeping
LCR measurement, DCR measurement, sweep measurement, continuous measurement and hig...
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